Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis

摘要

Studies of magnetic domain distributions in patterned magnetic materials are of pivotal importance in the areas of ultrahigh density magnetic recording, MRAM design, and miniaturized magnetic sensor arrays. Scanning ion microscopy with polarizationanalysis (SIMPA) is used to perform in situ topographic and magnetic domain imaging and focused ion beam(FIB) patterning. For FIB-patterned 30 nm thick Co films, it is found that rectangular Co bars of sizes between 10–30 μm exhibit S type, whereas circular shaped magnetic elements show C type micromagnetic magnetization patterns. It is shown that SIMPA provides a simple way to directly identify different micromagnetic domain patterns.